burn-in

Englisch - Türkisch

Definition von burn-in im Englisch Türkisch wörterbuch

yarıiletken belleğe yazmak

(to) (yariiletken) bellege yazmak

Relevante Übersetzungen

burnin

YAZMAK

Englisch - Englisch

Definition von burn-in im Englisch Englisch wörterbuch

The process of exercising an integrated circuit at elevated voltage and temperature This process accelerates failures normally seen as "infant mortality" in a chip (Those chips that would fail early during actual usage will fail during burn-in Those that pass have a life expectancy much greater than that required for normal usage )

A test defined in MIL-STD-883 that involves applying high-voltage electrical tests at high temperatures for long periods to detect and discard parts that would fail before their specified lifespan

A long term screening test (either vibration, temperature or combined test) that is effective in weeding out infant mortalities because it simulates actual or worst case operation of the device, accelerated through a time, power, and temperature relationship

A screening operation subjecting devices to high temperature bias (commonly at 125 degree celcius) for 160 hours (TI*)

The Photographic double exposure of a title or other subject matter over previously exposed film

If the same image is displayed on the monitor for a long period of time a copy of that image can become permanently burnt into the phosphor coating on the back of the glass, meaning that when it is turned off the image can still be seen This is called 'burn-in' and is the reason screen-savers were originally introduced

The process of exercising an integrated circuit at elevated voltage and temperature This process accelerates failure normally seen as "infant mortality" in a chip (Those chips that would fail early during actual usage will fail during burn-in Those that pass have a life expectancy much greater than that required for normal usage )

The process of exercising an integrated circuit at elevated voltage and temperature This process accelerates failure normally seen as “infant mortality” in a chip (Those chips that would fail early during actual usage will fail during burn-in Those that pass have a life expectancy much greater than that required for normal usage )

A screening operation subjecting devices to high temperature bias (commonly at 125 degree celcius) for 160 hours

Burn-Inis a term that is generally used to describe a test, or continuous operation, of a component, assembly, or system before it is put to use During a burn-In test, the component, assembly, or system is typically subjected to an elevated temperature and its operating electrical conditions Stabilization, defect detection, or inducing early-life failures are the objectives of a burn-in test or operation

The operation of newly manufactured power converters for a period of time prior to shipment The intent is to stabilize the converter and eliminate infant mortality by aging the device The time period and conditions (input power cycling, load switching, temperature, etc ) will vary from vendor to vendor However, the less stringent the conditions, the less likely it is that potential problems will be caught by the vendor

Operation of newly manufactured power supplies for some period of time prior to shipment The intent is to stabilize the power supply and eliminate infant mortality by aging the device The time period and conditions (input power cycling, load switching, temperature, etc ) varies from vendor-to-vendor However, the less stringent the conditions, the less likely it is that potential problems will be caught by the vendor

The process of electrically stressing a device (usually at high temperature and voltage) for a period of time long enough to cause failure of marginal electronics devices

The process of operating devices or equipment often under accelerated voltage, temperature, or load in order to screen out infant mortality failures

Continuously powering a product, often at constant elevated temperature, in order to accelerate the aging process Much less effective, in my opinion, than power-on ramping of temperature + random vibration

A process where a device or assembly is subjected to electrical or physical stress to simulate actual or accelerated use It is designed to verify the function of the device under test and also to weed out any possible devices with latent defects Go back to the MENU Go to END

The process in which a device is electrically stressed by subjecting it to an elevated temperature and voltage for an adequate period of time to cause the failure of a marginal device

A method used to screen out a component with early life failures

To darken a small area of a picture; named after the process done in a darkroom, where all but the affected area is masked in order to give extra exposure to only the unmasked area

The process of operating a power supply (usually at full load), typically in an elevated ambient temperature, immediately after manufacture This process is useful in eliminating early life failures

The operation of a newly fabricated device or system prior to application with the intent to stabilize the device, detect defects, and expose infant mortality In power supplies, a period during which a supply is energized and loaded to peak output, with the intent of finding potentially weak components Typical burn-in tests can include temperature cycling, input cycling, and/or load cycling

A technique used in printing photographs where by selected areas of an image are given more exposure than the rest, thus making them more dark, or burned Other areas are shaded from the light during this time, called dodging

running of a new computer for one or two days in order to verify that it works properly

Document imaging term that refers to permanently affixing annotations to the original image page by converting the annotation marks into image pixels and merging them with the underlying image pixels in the process Once annotations are burned-in, they become part of the base image and can no longer be manipulated by the annotation functions

A given period of time in which a system is fully stressed to make sure there are no faults

- See Age In